Testing is performed to determine a device's ability to operate in the presence of an interference signal propagated via free space. Malfunctions may be caused from either the magnetic (H) field or the electric (E) field component. The interference signal, typically in the range of DC to 18GHz, may be a carrier wave (CW), modulated signal, spike voltage or transient event.

In our Semi-Anechoic Facility electric (E) field strengths up to 200 V/m are generated from 10kHz to 18 GHz. Uniform Field Testing, in accordance with European Standards, is performed.

In our Shielded Room Facility stirred mode testing is performed.